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author | Thomas White <taw@physics.org> | 2010-01-06 17:11:00 +0100 |
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committer | Thomas White <taw@physics.org> | 2010-01-06 17:11:00 +0100 |
commit | 98d764ff7b382e8c99f17e2aa3b575b1a03c9654 (patch) | |
tree | ae084455b603e36ae9f3fe1f680796617af0cfb9 /src/pattern_sim.c | |
parent | 8ca0c87e2fa62a2176eeec65743632116fe3974e (diff) |
Update simulation details
Diffstat (limited to 'src/pattern_sim.c')
-rw-r--r-- | src/pattern_sim.c | 4 |
1 files changed, 3 insertions, 1 deletions
diff --git a/src/pattern_sim.c b/src/pattern_sim.c index d076eb7f..9a00b5d7 100644 --- a/src/pattern_sim.c +++ b/src/pattern_sim.c @@ -99,7 +99,9 @@ static void show_details() " S = solid angle of corresponding pixel\n" "\n" "Poisson counts are generated from the expected intensities using Knuth's\n" -"algorithm.\n" +"algorithm. When the intensity is sufficiently high that Knuth's algorithm\n" +"would result in machine precision problems, a normal distribution with\n" +"standard deviation sqrt(I) is used instead.\n" "\n" "Bloom of the CCD is included. Any excess intensity in a particular pixel\n" "is divided between the neighbouring pixels. Diagonal neighbours receive\n" |